Reliability Considerations for Compliant Pin Connectors:

Presented By: Steven Brewer

Tuesday, 18^th April, 2006, 5:00 pm to 6:00 pm

The last scheduled meeting of the year ended with Steven Brewer discussing the current challenges enterprises with board assembly in the compliant pin area.  The purpose of this study was to determine the standard specifications for processing through-hole assemblies which encompass copper nodule defects that protrude into the open barrels of plated through-holes (PTHs).  These standard specifications define the maximum size, detailed shape, and specific location of the copper nodule defects such that the final product can be assembled, and even reworked up to 2X, without compromising the reliability of the assembly. 

The installation and retention forces of the connector pins were recorded for a variety of nodules.  Following connector installation and removal, several of the test samples were cross-sectioned to evaluate the condition of the PTHs as well as the eye of the compliant pin.  Examples of bent pins, cracks in the PTH barrels, cracks in the compliant pins, and damage done to the internal circuitry/structure of the boards were highlighted during the discussion. 

In concluding the seminar, Steven outlined the reliability testing required in order to verify that creep and contact degradation would not compromise the electrical contact over the design life of the connectors.  The results of the study showed that press-fit connectors can be inserted into and extracted from a PCB despite the presence of copper nodule defect of a particular shape, size, and location.